| The following presentations were given in the Hall A3 theatre at the SEMICON Europa exhibition on 5th-6th April 2006.
They represent the very latest information on key topics in lead-free implementation. See the ELFNET Issues to Solutions Matrix for more details of the priority issues being considered within the ELFNET project.
Presentations given in the parallel network meetings for ELFNET members will be uploaded shortly.
EHC Legislation
Introduction, Pierre Lucas, SEMI
Update on REACH, Keith Huckle, Dow Corning
Update on PFO's, Aimee Bordeaux, SEMI
Update on IP/EuP, Julian Lageard, Intel Corporation
Update on RoHS, Paul Goodman, ERA
Supply Chain Issues
ELFNET Project Overview, Jeremy Pearce, ITRI/ELFNET Coordinator
Obsolescence, John Jones, IGG/Components Obsolescence Group
Component Supply, Dietmar Vieth, FarnellinOne
Marking and Labelling, Walter Huck, Murata/IEC TC97
Compliance Testing, Tom Perrett, Soldertec Global
Materials Declaration, Gerd Schulz, EPCOS/ZVEI
Lead-Free Standards
IECQ HSPM Certification, Valentine Menuet, LCIE
IPC Standards, Lars Wallin, IPC Europe
Semiconductor Standards, Andy Longford, PandA Europe
Design
Large and Complex Boards, Jacob Klerk, Philips Applied Technologies
Lead-Free Best Practice for SME's, Thomas Ahrens, Fraunhofer-ISIT
iNEMI Projects Overview, Chuck Richardson, iNEMI
Materials
Tin Whiskers, Antonello Vicenzo, Politecnico de Milano
Laminates, Per Johander, IVF
Lead-Free Solder Alloy Properties,Clemens Schmetterer, University of Vienna
Process
Hand Soldering, Eric Veninga, TNO
Rework and Repair, Anders Ekelof, Ericsson AB
The Role of Intermetallics, Toni Mattila, Helsinki University of Technology
Reliability
State-of-the-Art in Lead-Free Reliability, Guenter Grossmann, EMPA
Lead-Free Reliability Data, Bart Vandervelde, IMEC
Aerospace and Defence Perspective, Clive Simmonds, BAE Systems |